 |
Paul A. Meyer, Ph.D. |
GE Inspection Technologies |
top
 |
Jack William Raisch, Ph.D. |
top
 |
James Matthew Carson, Ph.D. |
top
 |
Gurvinder Pal Singh, Ph.D. |
top
 |
Graham Thomas, Ph.D. |
Lawernce Livermore National Lab |
top
 |
Alex Rogovsky, Ph.D. |
top
 |
Morris S. Good, Ph.D. |
top
 |
Michael J. Avioli, Ph.D. |
top
 |
John Bruce Nestleroth, Ph.D. |
Battelle |
top
 |
Prasanna Karpur, Ph.D. |
top
 |
Yi Hwan "Peter" Jeong, Ph.D. |
top
 |
Andrey Tverdokhhlebov, Ph.D. |
top
 |
Krishnan Balasubramanian, Ph.D. |
top
 |
Dale Jiao, Ph.D. |
top
 |
Manohar Bashyam, Ph.D. |
top
 |
John Ditri, Ph.D. |
top
 |
Yimei Huang, Ph.D. |
top
 |
Charles Thomas, Ph.D. |
top
 |
Jim Eder, Ph.D. |
top
 |
Jimin Zhang, Ph.D. |
top
 |
John Popovics, Ph.D. |
University of Illinois, Urbana-Champaign |
top
 |
Suresh Menon, Ph.D. |
top
 |
Krishna Rajana, Ph.D. |
top
 |
Younho Cho, Ph.D. |
top
 |
Derrick D. Hongerholt, Ph.D. |
top
 |
Hyeon Jae Shin, Ph.D. |
top
 |
mike Quarry, Ph.D. |
Lawrence Livermore National Lab |
top
 |
Jim Barshinger, Ph.D. |
GE Global Research |
top
 |
Jian Li, Ph.D. |
GE Global Research |
top
 |
Xiaoliang "George" Zhao, Ph.D. |
Intelligent Automation, Inc. |
top
 |
Thom Hay, Ph.D. |
FBS, Inc. |
top
 |
Hongxin Bian, Ph.D. |
top
 |
Zongqi "Sonnie" Sun, Ph.D. |
GE Global Research |
top
 |
Wei "Louie" Luo, Ph.D. |
GE Inspection Technologies |
top
 |
Li Zhang, Ph.D. |
FBS, Inc. |
top
 |
Chong Myoung Lee, Ph.D. |
top
 |
Huidong Gao, Ph.D. |
Innerpec Technologies, Inc. |
top
 |
Jing Mu, Ph.D. |
top
 |
Fei Yan, Ph.D. |
top
 |
Jason K. Van Velsor, Ph.D. |
top
 |
Xue "Kevin" Qi, Ph.D. |
top
 |
Padma Kumar Puthillath, Ph.D. |
top
 |
Jia "Jerry" Hua, Ph.D. |
top
 |
Yun Zhu, Ph.D. |
top
 |
jaya prakash koduru, Ph.D. |
top
 |
Sashidhar kumar parayitham, MS. |
top
 |
Siddharth Advani, MS. |
FBS, Inc. |
top
 |
Russell Love, BS. |
top
 |
Stacy Pagliocca, BS. |
Innerpec Technologies, Inc. |
top
 |
Bobby Parchuri, BS. |
top
