S. J. Fonash, O. O. Awadelkarim, M. Okandan, and M. Ozaita-Mintegui, Co-Inventors. “A novel technique for monitoring processing induced damage”, PSU Inv. Disc. Nos. 96-1569 and 96-1602.
Consultant with SEMATECH, Austin, TX.
research/ooa1/consulting.txt · Last modified: 2014/01/28 18:17 by 127.0.0.1
